Scanning Auger for Defect Root Cause Analysis: Advantages & Application Challenges
نویسندگان
چکیده
منابع مشابه
Root Cause and Error Analysis
Error is an inevitable part of life and cannot be completely eliminated, but it can be minimized. A root cause analysis is a technique for understanding the systematic error causes that is involved beyond a person or people to implement an errors and including field and environmental causes of errors when occur in this situation too. An important factor of an error occurrence is a root cause (c...
متن کاملA sustainability root cause analysis methodology and its application
In the design of chemical/energy production systems, a major challenge is to identify the bottleneck issues and improve its sustainability effectively. Due to the multi-dimensional feature of sustainability, how to account for the impacts of various design factors and the cause-and-effect relationships can be very difficult. This paper will present a sustainability root cause analysis method ba...
متن کاملRoot Cause Analysis of Large Scale Application Testing Results
We present a new root cause analysis algorithm for discovering the most likely causes of differences found in testing results of two versions of the same software. Problematic points in test and environment attribute hierarchies are presented to a user in a compact way which in turn allows saving time on test result processing. We have proven that for clearly separated problem causes our algori...
متن کاملScalable Root-Cause Analysis
From May 2 to May 7, 2010, the Dagstuhl Seminar 10181 Program Development for Extreme-Scale Computing was held in Schloss Dagstuhl Leibniz Center for Informatics. During the seminar, several participants presented their current research, and ongoing work and open problems were discussed. Abstracts of the presentations given during the seminar as well as abstracts of seminar results and ideas ar...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2005
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s143192760550895x